Location: EP 112
Primary Contact: Vanessa Kee
The JEOL JEM-2100 LaB6 transmission electron microscope (TEM) is equipped with
the high-resolution (HRP) style objective-lens pole piece to achieve
point resolution as small as
0.23 nm - small enough to observe lattice structure in many crystalline
materials. The instrument operates at a high tension of up to 200 KV,
corresponding to an electron wavelength of 2.5 pm. Image acquisition is
performed with a Gatan Orius bottom-mount,
14-bit, 11-megapixel CCD camera. An Oxford Inca energy-dispersive silicon-drift X-ray
(EDX) spectrometer is provided for compositional analysis and mapping
at high count rates. The instrument has scanning-TEM (STEM) capability,
with both bright-field and dark-field imaging modes, as well as both
secondary-electron and back-scattered electron imaging modes. Scan
control is achieved through a Gatan DigiScan II image acquisition
system. A hollow-cone illumination feature is available for conical
dark-field imaging.
A standard JEOL double-tilt specimen holder and a second JEOL low-background double-tilt holder
are provided for crystallographic and EDX analysis. A high-tilt
specimen retainer is also available for electron tomography.
A Gatan Model 628 single-tilt heating holder allows thermal treatments to
temperatures over 1000 °C
with in-situ observation.
Vanessa Kee, Research Engineer and Instrument Specialist
Nanoscience and Nanoengineering
South Dakota School of Mines and Technology
501 E. Saint Joseph St.
Rapid City, South Dakota 57701
Office: EP 235D
Phone: (605)394-1911
Email: Vanessa.Kee@sdsmt.edu
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