Location: EP 112
Primary Contact: Dr. Phil Ahrenkiel
The JEOL JEM-2100 LaB6 transmission electron microscope (TEM) is equipped with the high-resolution (HRP) style objective-lens pole piece to achieve point resolution as small as 0.23 nm - small enough to observe lattice structure in many crystalline materials. The instrument operates at a high tension of up to 200 KV, corresponding to an electron wavelength of 2.5 pm. Image acquisition is performed with a Gatan Orius bottom-mount, 14-bit, 11-megapixel CCD camera. An Oxford Inca energy-dispersive silicon-drift X-ray (EDX) spectrometer is provided for compositional analysis and mapping at high count rates. The instrument has scanning-TEM (STEM) capability, with both bright-field and dark-field imaging modes, as well as both secondary-electron and back-scattered electron imaging modes. Scan control is achieved through a Gatan DigiScan II image acquisition system. A hollow-cone illumination feature is available for conical dark-field imaging.
A standard JEOL double-tilt specimen holder and a second JEOL low-background double-tilt holder are provided for crystallographic and EDX analysis. A high-tilt specimen retainer is also available for electron tomography. A Gatan Model 628 single-tilt heating holder allows thermal treatments to temperatures over 1000 °C with in-situ observation.
Dr. Phil Ahrenkiel, Professor
Nanoscience and Nanoengineering Ph.D. Program
South Dakota School of Mines and Technology
501 E. Saint Joseph St.
Rapid City, South Dakota 57701
Office: EP 235D